Principles of Testing Electronic Systems
Mourad, Samiha
Principles of Testing Electronic Systems - 2nd - New Delhi Wiley India Pvt. Ltd. India 2015,c2000 - 420
This is a textbook and professional reference in an important field of Integrated Circuit Design. The book emphasizes examples and practical applications. In response to reviews, the author provides more theory than is presently in the manuscript. This makes this book a serious competitor to the leading text by Abramovici
Contents
DESIGN AND TEST.
· Overview of Testing.
· Defects, Failures, and Faults.
· Design Representation.
· VLSI Design Flow.
TEST FLOW.
· Role of Simulation in Testing.
· Automatic Test Pattern Generation.
· Current Testing.
DESIGN FOR TESTABILITY.
· Ad Hoc Test Techniques.
· Scan-Path Design.
· Boundary-Scan Testing.
· Built-in Self-Test.
SPECIAL STRUCTURES.
· Memory Testing.
· Testing FPGAs and Microprocessors.
· ADVANCED TOPICS.
· Synthesis for Testability.
· Testing SOCs.
Appendices.
Index.
9788126523061
Allied Informatics, Jaipur
Electronics
621.381 548 / MOU
Principles of Testing Electronic Systems - 2nd - New Delhi Wiley India Pvt. Ltd. India 2015,c2000 - 420
This is a textbook and professional reference in an important field of Integrated Circuit Design. The book emphasizes examples and practical applications. In response to reviews, the author provides more theory than is presently in the manuscript. This makes this book a serious competitor to the leading text by Abramovici
Contents
DESIGN AND TEST.
· Overview of Testing.
· Defects, Failures, and Faults.
· Design Representation.
· VLSI Design Flow.
TEST FLOW.
· Role of Simulation in Testing.
· Automatic Test Pattern Generation.
· Current Testing.
DESIGN FOR TESTABILITY.
· Ad Hoc Test Techniques.
· Scan-Path Design.
· Boundary-Scan Testing.
· Built-in Self-Test.
SPECIAL STRUCTURES.
· Memory Testing.
· Testing FPGAs and Microprocessors.
· ADVANCED TOPICS.
· Synthesis for Testability.
· Testing SOCs.
Appendices.
Index.
9788126523061
Allied Informatics, Jaipur
Electronics
621.381 548 / MOU