01446nam a2200229Ia 45000010008000000030004000080050017000120080041000290200018000700280037000880400024001250820021001491000020001702450045001902500009002352600056002443000008003005000328003085040543006366500016011797000021011950002296OSt20190326123425.0170602s9999    xx            000 0 und d  a9788126523061  q2016bAllied Informatics, Jaipur  bEnglishaBSDUcBSDU  a621.381 548bMOU  aMourad, Samiha  0aPrinciples of Testing Electronic Systems  a2nd   bWiley India Pvt. Ltd. Indiaa New Delhic2015,c2000  a420  aThis is a textbook and professional reference in an important field of Integrated Circuit Design. The book emphasizes examples and practical applications. In response to reviews, the author provides more theory than is presently in the manuscript. This makes this book a serious competitor to the leading text by Abramovici  aContents
DESIGN AND TEST.

· Overview of Testing.

· Defects, Failures, and Faults.

· Design Representation.

· VLSI Design Flow.

TEST FLOW.

· Role of Simulation in Testing.

· Automatic Test Pattern Generation.

· Current Testing.

DESIGN FOR TESTABILITY.

· Ad Hoc Test Techniques.

· Scan-Path Design.

· Boundary-Scan Testing.

· Built-in Self-Test.

SPECIAL STRUCTURES.

· Memory Testing.

· Testing FPGAs and Microprocessors.

· ADVANCED TOPICS.

· Synthesis for Testability.

· Testing SOCs.

Appendices.

Index.  aElectronics  a Zorian, Yervant