01538nam a2200253Ia 4500 597 597 0002296 OSt 20190326123425.0 170602s9999 xx 000 0 und d 9788126523061 2016 Allied Informatics, Jaipur English BSDU BSDU 621.381 548 MOU Mourad, Samiha Principles of Testing Electronic Systems 2nd Wiley India Pvt. Ltd. India New Delhi 2015,c2000 420 This is a textbook and professional reference in an important field of Integrated Circuit Design. The book emphasizes examples and practical applications. In response to reviews, the author provides more theory than is presently in the manuscript. This makes this book a serious competitor to the leading text by Abramovici Contents DESIGN AND TEST. · Overview of Testing. · Defects, Failures, and Faults. · Design Representation. · VLSI Design Flow. TEST FLOW. · Role of Simulation in Testing. · Automatic Test Pattern Generation. · Current Testing. DESIGN FOR TESTABILITY. · Ad Hoc Test Techniques. · Scan-Path Design. · Boundary-Scan Testing. · Built-in Self-Test. SPECIAL STRUCTURES. · Memory Testing. · Testing FPGAs and Microprocessors. · ADVANCED TOPICS. · Synthesis for Testability. · Testing SOCs. Appendices. Index. Electronics Zorian, Yervant ddc BK 0 0 ddc 0 0 BSDU BSDU 2016-12-12 779.00 0 621.381 548 MOU 002296 2020-02-12 00:00:00 779.00 2017-06-02 BK 0 0 ddc 0 0 BSDU BSDU 2016-12-12 779.00 0 621.381 548 MOU 002297 2020-02-12 00:00:00 779.00 2017-06-02 BK