01769nam a2200277Ia 4500999001300000001000800013003000400021005001700025008004100042020001800083028003700101040002400138082002100162100002000183245004500203250000900248260005600257300000800313500032800321504054300649650001601192700002101208942001201229952012501241952012501366  c597d5970002296OSt20190326123425.0170602s9999    xx            000 0 und d  a9788126523061  q2016bAllied Informatics, Jaipur  bEnglishaBSDUcBSDU  a621.381 548bMOU  aMourad, Samiha  0aPrinciples of Testing Electronic Systems  a2nd   bWiley India Pvt. Ltd. Indiaa New Delhic2015,c2000  a420  aThis is a textbook and professional reference in an important field of Integrated Circuit Design. The book emphasizes examples and practical applications. In response to reviews, the author provides more theory than is presently in the manuscript. This makes this book a serious competitor to the leading text by Abramovici  aContents
DESIGN AND TEST.

· Overview of Testing.

· Defects, Failures, and Faults.

· Design Representation.

· VLSI Design Flow.

TEST FLOW.

· Role of Simulation in Testing.

· Automatic Test Pattern Generation.

· Current Testing.

DESIGN FOR TESTABILITY.

· Ad Hoc Test Techniques.

· Scan-Path Design.

· Boundary-Scan Testing.

· Built-in Self-Test.

SPECIAL STRUCTURES.

· Memory Testing.

· Testing FPGAs and Microprocessors.

· ADVANCED TOPICS.

· Synthesis for Testability.

· Testing SOCs.

Appendices.

Index.  aElectronics  a Zorian, Yervant  2ddccBK  00102ddc4070aBSDUbBSDUd2016-12-12g779.00l0o621.381 548 MOUp002296r2020-02-12 00:00:00v779.00w2017-06-02yBK  00102ddc4070aBSDUbBSDUd2016-12-12g779.00l0o621.381 548 MOUp002297r2020-02-12 00:00:00v779.00w2017-06-02yBK