| 000 | 01553nam a2200253Ia 4500 | ||
|---|---|---|---|
| 999 |
_c401 _d401 |
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| 001 | 0001334 | ||
| 003 | OSt | ||
| 005 | 20190302112601.0 | ||
| 008 | 170602s9999 xx 000 0 und d | ||
| 020 | _a9788126510962 | ||
| 028 |
_q2016 _bAllied Informatics, Jaipur |
||
| 040 |
_bEnglish _aBSDU _cBSDU |
||
| 082 |
_a621.381 73 _bMUL |
||
| 100 | _aMuller, Richerd S | ||
| 245 | 0 | _aDevice Electronics for Integrated Circuits | |
| 250 | _a3rd | ||
| 260 |
_bWiley India Pvt. Ltd. India _a New Delhi _c2014,c2003 |
||
| 300 | _a528 | ||
| 500 | _aThis book provides all the required information for a course in modern device electronics taken by undergraduate electrical engineers. It offers coverage of silicon technology, several topics in basic semiconductor physics, and Hall-effect sensors. The chapters on MOSFET focus on mobility variations and threshold-voltage dependence. Additional topics include VLSI devices, short channel effects, and computer modeling. | ||
| 504 | _aContens: · Semiconductor Electronics · Silicon Technology · Metal-Semiconductor Contacts · pn Junctions · Currents in pn Junctions · Bipolar Transistors I: Basic Properties · Bipolar Transistors II: Limitations and Models · Properties of the Metal-Oxide-Silicon System · Mos Field-Effect Transistors I: Physical Effects and Models · Mos Field-Effect Transistors II: High-Field Effects Answers to Selected Problems Selected List of Symbols Index | ||
| 650 | _aElectronics | ||
| 700 | _a Kamins, Theodore I | ||
| 942 |
_2ddc _cBK |
||