| 000 | 01645nam a2200241Ia 4500 | ||
|---|---|---|---|
| 999 |
_c511 _d511 |
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| 001 | 0001923 | ||
| 003 | OSt | ||
| 005 | 20190314163528.0 | ||
| 008 | 170602s9999 xx 000 0 und d | ||
| 020 | _a9788126532605 | ||
| 028 |
_q2016 _bAllied Informatics, Jaipur |
||
| 040 |
_bEnglish _aBSDU _cBSDU |
||
| 082 |
_a621.381.52 _bMAY . |
||
| 100 | _aMay, Gary S | ||
| 245 | 0 | _aFundamentals of Semiconductor Fabrication | |
| 260 |
_bWiley India Pvt. Ltd. India _a New Delhi _c2016,c2004 |
||
| 300 | _a305 | ||
| 500 | _aFrom crystal growth to integrated devices and circuits, this new book offers a basic, up-to-date introduction to semiconductor fabrication technology, including both the theoretical and practical aspects of all major steps in the fabrication sequence. | ||
| 504 | _aContents · Introduction. · Crystal Growth. · Silicon Oxidation. · Photolithography. · Etching. · Diffusion. · Ion Implantation. · Film Deposition. · Process Integration. · IC Manufacturing. · Future Trends and Challenges. Appendix A: List of Symbols. Appendix B: International System of Units (SI Units). Appendix C: Unit Prefixes. Appendix D: Greek Alphabet. Appendix E: Physical Constants. Appendix F: Properties of Si and GaAs at 300 K. Appendix G: Some Properties of the Error Function. Appendix H: Basic Kinetic Theory of Gases. Appendix I: SUPREM Commands. Appendix J: Running PROLITH. Appendix K. Percentage Points of the t Distribution. Appendix L: Percentage Points of the F Distribution. Index. | ||
| 650 | _aElectronics | ||
| 700 | _a Sze, Simon M | ||
| 942 |
_2ddc _cBK |
||